KSL-89-76 + redirect page
Combining Experiential and Theoretical Knowledge at Multiple Levels of Granularity in the Domain of Semiconductor Fabrication Processes + Has identifier
Combining Experiential and Theoretical Knowledge at Multiple Levels of Granularity in the Domain of Semiconductor Fabrication Processes + Ksl tr id
Combining Experiential and Theoretical Knowledge at Multiple Levels of Granularity in the Domain of Semiconductor Fabrication Processes + Number
| Combining Experiential and Theoretical Knowledge at Multiple Levels of Granularity in the Domain of Semiconductor Fabrication Processes |
Bibtype
techreport
Has publishing details
November,1989
Has title
Combining Experiential and Theoretical Knowledge at Multiple Levels of Granularity in the Domain of Semiconductor Fabrication Processes
Has where published
KSL-89-76
Has year
1989
Title
Combining Experiential and Theoretical Knowledge at Multiple Levels of Granularity in the Domain of Semiconductor Fabrication Processes
Year
1989
Abstract
Engineering knowledge incorporates both em … Engineering knowledge incorporates both empirical and theoretical knowledge, and exists at multiple levels of abstraction, approximation and granularity. Thus, representing and reasoning with engineering knowledge requires the ability to represent and reason with experiential knowledge and theoretical knowledge at multiple levels of granularity, and also meta-level knowledge concerning when it is appropriate to apply each type of knowledge, and how to translate between them. Three existing systems, PIES, DAS and CPS, encode knowledge about a single engineering domain: semiconductor fabrication. These systems encode, respectively, experiential knowledge concerning how to diagnose failures in manufacturing, and theoretical models at two different levels of granularity concerning how the manufacturing process works (which also support the same diagnostic task). It is proposed that a single system be constructed that will integrate the representations and reasoning mechanisms of the PIES, DAS and CPS systems. The system's primary high-level task will be diagnosis of problems in the manufacture of integrated circuits. The primary purpose will be study the issues surrounding the integration and utilization of knowledge at different levels of granularity. A secondary purpose will be to investigate an approach to the 'knowledge re-use' problem based on a taxonomy of reasoning tasks. em based on a taxonomy of reasoning tasks.
Author
John L. Mohammed +
Has author
John L. Mohammed +
Has identifier
Combining Experiential and Theoretical Knowledge at Multiple Levels of Granularity in the Domain of Semiconductor Fabrication Processes +
Institution
Knowledge Systems, AI Laboratory +
Ksl tr id
Combining Experiential and Theoretical Knowledge at Multiple Levels of Granularity in the Domain of Semiconductor Fabrication Processes +
Month
November +
Number
Combining Experiential and Theoretical Knowledge at Multiple Levels of Granularity in the Domain of Semiconductor Fabrication Processes +
Process note
NO +
Categories KSL Technical Report +, Publication +, Technical Report +
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